Publications
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Xia, Z., Lu, L., Li, J., Kwok, H. and Wong, M. (2018). A Bottom-Gate Metal–Oxide Thin-Film Transistor With Self-Aligned Source/Drain Regions. IEEE Transactions on Electron Devices, 65(7), pp.2820-2826. doi:10.1109/TED.2018.2833057 |
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Feng, Z., Lu, L., Wang, S., Li, J., Xia, Z., Kwok, H. and Wong, M. (2018). Fluorination-Enabled Monolithic Integration of Enhancement- and Depletion-Mode Indium-Gallium-Zinc Oxide TFTs. IEEE Electron Device Letters, 39(5), pp.692-695. doi:10.1109/LED.2018.2818949 |
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Chan, E., Lin, D., Lu, L., Zhang, D., Guo, S., Zhang, Y., Chau, K. and Wong, M. (2018). Realization and Characterization of a Bulk-Type All-Silicon High Pressure Sensor. Journal of Microelectromechanical Systems, 27(2), pp.231-238. doi:10.1109/JMEMS.2017.2786730 |
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Lu, L., Xia, Z., Li, J., Feng, Z., Wang, S., Kwok, H. and Wong, M. (2018). A Comparative Study on Fluorination and Oxidation of Indium–Gallium–Zinc Oxide Thin-Film Transistors. IEEE Electron Device Letters, 39(2), pp.196-199. doi:10.1109/LED.2017.2781700 |
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Li, J., Lu, L., Chen, R., Kwok, H. and Wong, M. (2018). A Physical Model for Metal–Oxide Thin-Film Transistor Under Gate-Bias and Illumination Stress. IEEE Transactions on Electron Devices, 65(1), pp.142-149. doi:10.1109/TED.2017.2771800 |
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